Electro-Optic Sampling of Single Electron Beam Bunches of Ultrashort Duration
نویسندگان
چکیده
The effect of ultrafast electron beam bunch dynamics on single shot electro-optic sampling detection schemes is examined. It is shown that ultrashort electron bunch fields of adequate magnitude can dynamically impose additional bandwidth on laser probe pulses. The significance of this effect is evaluated by comparing the dynamics of the laser probe to that of the nonradiative field of a single electron bunch for a given crystal material. Dynamic effects can be distinguished with ultrafast temporal resolution of the transmitted probe spectrum. Furthermore, velocity matching of probe and bunch fields in a co-propagation scheme is less restrictive. Such time resolved spectra then can noninvasively determine single bunch dynamics and represent a new type of electro-optic sampling. PACS codes: 41.60.Cr, 41.75.Ht, 42.25.Lc, 42.65.Re
منابع مشابه
Work supported by US Department of Energy contract DE-AC02-76SF00515 NONINVASIVE LASER PROBING OF ULTRASHORT SINGLE ELECTRON BUNCHES FOR ACCELERATOR AND LIGHT SOURCE DEVELOPMENT
Companion development of ultrafast electron beam diagnostics capable of noninvasively resolving single bunch detail is essential for the development of high energy, high brightness accelerator facilities and associated beam-based light source applications. Existing conventional accelerators can exhibit timing-jitter down to the 100 femtosecond level which exceeds their single bunch duration cap...
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